Imaging and surface analysis

    Atomic Force Microscope (AFM)

    The AFM maps nanoscale topography by scanning a sharp tip back and forth across a surface.  The tip is mounted on a flexible cantilever that is able to apply force to the surface, depending on the stiffness of the cantilever. It produces dimensional images with angstrom-scale variations in height and nanometer scale spatial resolution. In addition to imaging, roughness and force profiles can be obtained.

    Agilent 5420

    • Contact and noncontact imaging
    • PicoView and PicoImage software
    • Internal MAC Mode III controller
    • Samples can be imaged in air, liquid, or controlled gas environments
    • Variety of scanners and nosecones to enable imaging of a wide range of samples
    • Operates at temperatures from -10 C to +200 C
    • Scanner head approaches sample

    Contact: Aric Opdahl

    Agilent-5420

    Agilent 5500

    • Contact and noncontact imaging
    • PicoView and PicoImage software
    • External MAC Mode III controller
    • Samples can be imaged in air, liquid, or controlled gas environments
    • Variety of scanners and nosecones to enable imaging of a wide range of samples
    • Operates at temperatures from -10 C to +200 C
    • Sample approaches scanner head

    Contact: Seth King

    Agilent 5500

    Contact Angle Goniometer

    The goniometer is used to measure the surface tension/energies of liquids and solids. For example, the instrument can be used to characterize the hydrophobic or hydrophilic nature of a surface.

    AST 2500

    • Manual drop setting
    • Can be used with a variety of liquid and solid samples

    Contact: Aric Opdahl

    AST-2500

    Fluorescence Microscope

    This microscope is used to image fluorescent samples. Images are taken of emitted light from the sample after being hit with a beam of light at a sufficient wavelength to incite excitation. Samples that are not autofluorescent are prestained with a fluorescent dye before imaging. Commonly used for biological samples (e.g. cells, platelets).

    Nikon Eclipse E600

    • Upright compound microscope
    • 10, 20, 40, 60, 100x objectives
    • Differential interference contrast (DIC) on 40-100x
    • Filters for blue, green, and red fluorescence

    Eclipse E600 Calendar

    Contact: Tony Sanderfoot or Sarah Lantvit

    Nikon-Eclipse-E600

    Nikon Eclipse 80i

    • Upright compound microscope
    • 2, 10, 20, 40, 60, 100x objectives
    • DIC on 20-100x
    • Darkfield on 10 and 40x
    • Filters for blue, green, red, and far red fluorescence

    Eclipse 80i Calendar

    Contact: Tony Sanderfoot or Sarah Lantvit

    Nikon-Eclipse-80i

    Cameras

    • 3 cooled CCD cameras for fluorescence and gray scale imaging
    • 2 research grade color CCD cameras
    • 1 high speed digital video camera

          3rd Fluorescent Microscope Calendar

    Laser Scanning Confocal Fluorescence Microscope

    Used to image fluorescent samples. Confocal microscopy allows for scanning a sample's surface with a concentrated beam, instead of illuminating the entirety of the sample at once. This allows for increased quality of images with greater resolution over a traditional fluorescence microscope.

    Nikon CS1

    • Built on Nikon Eclipse TE2000-U inverted compound microscope
    • 2, 10, 20, 40, 60, 100x objectives
    • DIC on 10-100x
    • 4 lasers allow for almost any fluorochrome (capable of 3 colors at once - blue, green, and red or green, red, and far red)
    • Motorized stage in xy plane
    • Capable of fluorescence resonance energy transfer (FRET) and calcium ratio imaging experiments
    • Optically sections specimens several mm in depth
    • Generates 3D images that can be rotated

    Confocal Calendar

    Contact: Tony Sanderfoot or Sarah Lantvit

    Nikon-CS1

    Scanning Electron Microscope with Energy Dispersive Spectrometer (SEM/EDS)

    The SEM allows for high resolution images to be taken of a variety of samples by bombarding the surface of the material with electrons and detecting the secondary electron yield. A high vacuum technique, this model allows for the sampling of non-traditional materials and simplified sample preparation due to extended pressure options. The EDS allows for elemental analysis of the material imaged in the SEM.

    Zeiss EVO HD with Bruker EDS

    • 3.7 nm/129 eV resolution for imaging and EDS, respectively
    • Extended Pressure mode
    • SmartSEM and ESPRIT software
    • Peltier cooling stage
    • STEM capabilities
    • Secondary and backscattered electron detection
    • Line, point, and area mapping EDS

    SEM Calendar

    Contact: Sarah Lantvit

    Zeiss-EVO-HD-Bruker-EDS

    Scanning Tunneling Microscope (STM)

    Similar to AFM, but relies on changes in current to look at the surface, rather than changes in force.

    Agilent 4400

    • Imaging in atmosphere, inert gas, or solution environments
    • Atomic resolution

    Contact: Seth King

    Agilent-4400

    Surface Profilometer

    A surface imaging technique that allows for surface mapping and roughness measurements on a larger scale than the AFM.

    KLA Tencor P-7

    • Stylus profiler
    • 150 mm scan length standard

    Contact: Seth King

    KLA-Tencor-P-7