Imaging and surface analysis

     

Atomic Force Microscope (AFM)

The AFM maps nanoscale topography by scanning a sharp tip back and forth across a surface.  The tip is mounted on a flexible cantilever that is able to apply force to the surface, depending on the stiffness of the cantilever. It produces dimensional images with angstrom-scale variations in height and nanometer scale spatial resolution. In addition to imaging, roughness and force profiles can be obtained.

Agilent 5420

  • Contact and noncontact imaging
  • PicoView and PicoImage software
  • Internal MAC Mode III controller
  • Samples can be imaged in air, liquid, or controlled gas environments
  • Variety of scanners and nosecones to enable imaging of a wide range of samples
  • Operates at temperatures from -10 C to +200 C
  • Scanner head approaches sample

Contact: Aric Opdahl

Agilent-5420

Agilent 5500

  • Contact and noncontact imaging
  • PicoView and PicoImage software
  • External MAC Mode III controller
  • Samples can be imaged in air, liquid, or controlled gas environments
  • Variety of scanners and nosecones to enable imaging of a wide range of samples
  • Operates at temperatures from -10 C to +200 C
  • Sample approaches scanner head

Contact: Seth King

Agilent 5500

Contact Angle Goniometer

The goniometer is used to measure the surface tension/energies of liquids and solids. For example, the instrument can be used to characterize the hydrophobic or hydrophilic nature of a surface.

AST 2500

  • Manual drop setting
  • Can be used with a variety of liquid and solid samples

Contact: Aric Opdahl

AST-2500

Fluorescence Microscope

This microscope is used to image fluorescent samples. Images are taken of emitted light from the sample after being hit with a beam of light at a sufficient wavelength to incite excitation. Samples that are not autofluorescent are prestained with a fluorescent dye before imaging. Commonly used for biological samples (e.g. cells, platelets).

Nikon Eclipse E600

  • Upright compound microscope
  • 10, 20, 40, 60, 100x objectives
  • Differential interference contrast (DIC) on 40-100x
  • Filters for blue, green, and red fluorescence

Eclipse E600 Calendar

Contact: Tony Sanderfoot or Sarah Lantvit

Nikon-Eclipse-E600

Nikon Eclipse 80i

  • Upright compound microscope
  • 2, 10, 20, 40, 60, 100x objectives
  • DIC on 20-100x
  • Darkfield on 10 and 40x
  • Filters for blue, green, red, and far red fluorescence

Eclipse 80i Calendar

Contact: Tony Sanderfoot or Sarah Lantvit

Nikon-Eclipse-80i

Cameras

  • 3 cooled CCD cameras for fluorescence and gray scale imaging
  • 2 research grade color CCD cameras
  • 1 high speed digital video camera

      3rd Fluorescent Microscope Calendar

Laser Scanning Confocal Fluorescence Microscope

Used to image fluorescent samples. Confocal microscopy allows for scanning a sample's surface with a concentrated beam, instead of illuminating the entirety of the sample at once. This allows for increased quality of images with greater resolution over a traditional fluorescence microscope.

Nikon CS1

  • Built on Nikon Eclipse TE2000-U inverted compound microscope
  • 2, 10, 20, 40, 60, 100x objectives
  • DIC on 10-100x
  • 4 lasers allow for almost any fluorochrome (capable of 3 colors at once - blue, green, and red or green, red, and far red)
  • Capable of fluorescence resonance energy transfer (FRET) and calcium ratio imaging experiments
  • Optically sections specimens several mm in depth
  • Generates 3D images that can be rotated

Confocal Calendar

Contact: Tony Sanderfoot or Sarah Lantvit

Nikon-CS1

Scanning Electron Microscope with Energy Dispersive Spectrometer (SEM/EDS)

The SEM allows for high resolution images to be taken of a variety of samples by bombarding the surface of the material with electrons and detecting the secondary electron yield. A high vacuum technique, this model allows for the sampling of non-traditional materials and simplified sample preparation due to extended pressure options. The EDS allows for elemental analysis of the material imaged in the SEM.

Zeiss EVO HD with Bruker EDS

  • 3.7 nm/129 eV resolution for imaging and EDS, respectively
  • Extended Pressure mode
  • SmartSEM and ESPRIT software
  • Peltier cooling stage
  • STEM capabilities
  • Secondary and backscattered electron detection
  • Line, point, and area mapping EDS

SEM Calendar

Contact: Sarah Lantvit

Zeiss-EVO-HD-Bruker-EDS

Scanning Tunneling Microscope (STM)

Similar to AFM, but relies on changes in current to look at the surface, rather than changes in force.

Agilent 4400

  • Imaging in atmosphere, inert gas, or solution environments
  • Atomic resolution

Contact: Seth King

Agilent-4400

Surface Profilometer

A surface imaging technique that allows for surface mapping and roughness measurements on a larger scale than the AFM.

KLA Tencor P-7

  • Stylus profiler
  • 150 mm scan length standard

Contact: Seth King

KLA-Tencor-P-7