X-ray Diffractometer (XRD)

    Uses an X-ray beam to determine the crystal structure of materials in thin films or powders.

    Siemens D500

    • MIDI DataScan 5 data collection software
    • Jade 9 and Match! data analysis software
    • Cu, Mo, and Co X-ray sources
    • Thin-film, capillary, and reflectivity stages
    • X-123 secondary fluorescence detector for qualitative/quantitative XRF analysis

    XRD Calendar

    Contact: Seth King or Sarah Lantvit


    X-ray Fluorescence Spectrometer (XRF)

    Used for non-destructive chemical analysis particularly in bulk samples.

    Bruker Tracer III-V+

    • Hand-held detector
    • Si-Pin detector with a resolution of 190eV at 10000 cps
    • Vacuum pump accessory to detect light elements (Mg to Cl) and enhanced signal for elements K to Fe

    Contact: Seth King or Colin Belby


    X-ray Photoelectron Spectrometer (XPS)

    A high vacuum technique, XPS allows for surface sensitive measurements of elemental composition and binding environments to be obtained. Considered a surface sensitive technique, as the majority of the signal obtained is from the surface of the material.

    PHI 5400

    • Auger Scan Software
    • Dual anode Al and Mg X-ray source
    • Ar sputter gun for surface preparation and depth profiling
    • 4-pocket e-beam evaporator (rods or crucibles) for in-situ deposition experiments

    Contact: Seth King or Sarah Lantvit