X-ray

     

X-ray Diffractometer (XRD)

Uses an X-ray beam to determine the crystal structure of materials in thin films or powders.

Siemens D500

  • MIDI DataScan 5 data collection software
  • Jade 9 and Match! data analysis software
  • Cu, Mo, and Co X-ray sources
  • Thin-film, capillary, and reflectivity stages
  • X-123 secondary fluorescence detector for qualitative/quantitative XRF analysis

XRD Calendar

Contact: Seth King or Sarah Lantvit

Siemens-D500

X-ray Fluorescence Spectrometer (XRF)

Used for non-destructive chemical analysis particularly in bulk samples.

Bruker Tracer III-V+

  • Hand-held detector
  • Si-Pin detector with a resolution of 190eV at 10000 cps
  • Vacuum pump accessory to detect light elements (Mg to Cl) and enhanced signal for elements K to Fe

Contact: Seth King or Colin Belby

 

X-ray Photoelectron Spectrometer (XPS)

A high vacuum technique, XPS allows for surface sensitive measurements of elemental composition and binding environments to be obtained. Considered a surface sensitive technique, as the majority of the signal obtained is from the surface of the material.

PHI 5400

  • Auger Scan Software
  • Dual anode Al and Mg X-ray source
  • Ar sputter gun for surface preparation and depth profiling
  • 4-pocket e-beam evaporator (rods or crucibles) for in-situ deposition experiments

Contact: Seth King or Sarah Lantvit

PHI-5400