X-ray
X-ray Diffractometer (XRD)
Uses an X-ray beam to determine the crystal structure of materials in thin films or powders.
Siemens D500
- MIDI DataScan 5 data collection software
- Jade 9 and Match! data analysis software
- Cu, Mo, and Co X-ray sources
- Thin-film, capillary, and reflectivity stages
- X-123 secondary fluorescence detector for qualitative/quantitative XRF analysis
Contact: Seth King or Sarah Lantvit
X-ray Fluorescence Spectrometer (XRF)
Used for non-destructive chemical analysis particularly in bulk samples.
Bruker Tracer III-V+
- Hand-held detector
- Si-Pin detector with a resolution of 190eV at 10000 cps
- Vacuum pump accessory to detect light elements (Mg to Cl) and enhanced signal for elements K to Fe
Contact: Seth King or Colin Belby
X-ray Photoelectron Spectrometer (XPS)
A high vacuum technique, XPS allows for surface sensitive measurements of elemental composition and binding environments to be obtained. Considered a surface sensitive technique, as the majority of the signal obtained is from the surface of the material.
PHI 5400
- Auger Scan Software
- Dual anode Al and Mg X-ray source
- Ar sputter gun for surface preparation and depth profiling
- 4-pocket e-beam evaporator (rods or crucibles) for in-situ deposition experiments
Contact: Seth King or Sarah Lantvit
